@inproceedings{thacker2002compliant,
  title={Compliant probe substrates for testing high pin-count chip scale packages},
  author={Thacker, Hiren D and Bakir, Muhannad S and Keezer, David C and Martin, Kevin P and Meindl, James D},
  booktitle={52nd Electronic Components and Technology Conference 2002.(Cat. No. 02CH37345)},
  pages={1188--1193},
  year={2002},
  organization={IEEE}
}