@inproceedings{bakir2006dual,
  title={Dual-mode electrical-optical flip-chip I/O interconnects and a compatible probe substrate for wafer-level testing},
  author={Bakir, Muhannad S and Dang, Bing and Thacker, Hiren D and Ogunsola, Oluwafemi O and Ogra, Rohit and Meindl, James D},
  booktitle={56th Electronic Components and Technology Conference 2006},
  pages={8--pp},
  year={2006},
  organization={IEEE}
}