@article{liu2014situ,
  title={In-situ microscale through-silicon via strain measurements by synchrotron x-ray microdiffraction exploring the physics behind data interpretation},
  author={Liu, Xi and Thadesar, Paragkumar A and Taylor, Christine L and Oh, Hanju and Kunz, Martin and Tamura, Nobumichi and Bakir, Muhannad S and Sitaraman, Suresh K},
  journal={Applied Physics Letters},
  volume={105},
  number={11},
  pages={112109},
  year={2014},
  publisher={AIP Publishing}
}