@inproceedings{thacker2005,
  title={"Probe module for wafer-level testing of gigascale chips with polymer pillar-based electrical and optical I/O interconnects},
  author={Thacker, H., Ogunsola, O., Bakir, Muhannad S. and Meindl, J.},
  booktitle={SRC TECHCON},
  pages={},
  year={2005},
  organization={SRC}
}