@inproceedings{thacker2005high, title={High-density probe substrate for testing optical interconnects}, author={Thacker, Hiren D and Ogunsola, Oluwafemi O and Bakir, Muhannad S and Meindl, James D}, booktitle={Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005.}, pages={159--161}, year={2005}, organization={IEEE} }